Assessment of Wheat Genotypes for Spot Blotch and Other Traits under Normal and Diseased Conditions

Abstract

Exploring the existing variability among wheat germplasm lines for trait of interest is of utmost importance for plant breeders to start the plant breeding activity under crop improvement programme. Hence, with this aim, 93 wheat genotypes were evaluated for spot blotch resistance and other traits in normal and artificial epiphytotic conditions during rabi, 2018-19 at Agriculture Research Farm, Institute of Agricultural Sciences, Banaras Hindu University. Findings revealed the presence of considerable variability among the genotypes for the studied traits grown in two different conditions hence, there is ample scope to develop superior genotypes along with spot blotch disease resistance. The phenotypic coefficient of variation (PCV) and genotypic coefficient of variation (GCV) shows the minute difference for area under disease progress curve (AUDPC) and other traits in both conditions, indicating low environmental influence. High heritability with high genetic advancement for spot blotch disease resistance specified that its inheritance pattern may be additive in nature; therefore, direct selection could be effective in a breeding programme. In both conditions, genotype Raj 3814 had the lowest disease severity; in each environment, we identified 10 highly resistant genotypes. Thus, these genotypes can be used as resistant parent to breed the new source of resistance along with better yield. A negative correlation of AUDPC with seed yield per plant and other traits implies indirect selection of these traits to minimize spot blotch disease severity and increase crop yield.